3D characterization and metrology of nanostructures by electron tomography / J. C. Hernandez, A. B. Hungria, J. A. Perez-Omil, M. S. Moreno, E. A. Coronado, G. CEMPURA, A. KRUK, P. A. Midgley // Microscopy and Microanalysis ; ISSN 1431-9276. — 2008 vol. 14 iss. 52 Suppl. 2, s. 284–286. — Extended abstract of a paper presented at Microscopy and microanalysis 2008 : Albuquerque, New Mexico, USA, August 3–August 7, 2008. — Cambridge, 2008. — tekst: http://search.proquest.com/docview/220319432/fulltextPDF/A7C1BC67F66248AFPQ/142?accountid=48679

3D characterization and metrology of oxide nanoparticles in ODS alloy by electron tomography / A. KRUK, B. DUBIEL, W. OSUCH, G. CEMPURA, J. C. Hernandez, A. CZYRSKA-FILEMONOWICZ // W: MC 2009 [Dokument elektroniczny] : Microscopy Conference in Graz, Austria : 30 August–4 September 2009 / eds. G. Kothleitner, [et al.]. — Wersja do Windows. — Dane tekstowe. — Graz : Verlag der TU, cop. 2009. — 1 dysk optyczny. — Na dysku optycznym dod.: First joint meeting of Dreiländertagung & Multinational congress on Microscopy. — ISBN: 978-3-85125-062-6. — S. 101–102. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM. — Bibliogr. s. 102. — Toż W: MC 2009 : Microscopy Conference, Graz, Austria, 30 August– 4 September 2009 : first joint meeting of Dreiländertagung & Multinational congress on Microscopy. Vol. 1, Instrumentation and methodology / eds. Gerald Kothleitner, Manfred Leisch. — Graz : Verlag der Technischen Universität : Austrian Society of Electron Microscopy, cop. 2009

A bottom-up process of self-formation of highly conductive titanium oxide ($TiO$) nanowires on reduced $SrTiO_3$ / Dominik Wrana, Christian Rodenbücher, Benedykt R. Jany, Oleksandr KRYSHTAL, Grzegorz CEMPURA, Adam KRUK, Paulina Indyka, Krzysztof Szot, Franciszek Krok // Nanoscale ; ISSN 2040-3364. — 2019 vol. 11 iss. 1, s. 89–97. — Bibliogr. s. 96–97. — Publikacja dostępna online od: 2018-08-28. — tekst: https://pubs-1rsc-1org-100001e5l0228.wbg2.bg.agh.edu.pl/en/content/articlepdf/2019/nr/c8nr04545c

Advanced electron microscopy for aeronautics and energy systems : qualitative and quantitative approach / Grzegorz CEMPURA, Adam KRUK // W: EM'2020 [Dokument elektroniczny] : XVII international conference on Electron Microscopy : November 30\textsuperscript{th} - December 2\textsuperscript{nd} 2020, Katowice, Poland : book of abstracts / Silesian University of Technology, Institute of Metallurgy and Materials Science. Polish Academy of Sciences, PTMi. — Wersja do Windows. — Dane tekstowe. — [Poland : Silesian University of Technology], [2020]. — 1 dysk optyczny. — S. 31. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM

Analysis of $\gamma$' and $\gamma$” precipitates in nickel-base superalloy inconel 718 using HRTEM and 3D visualisation methods : abstract / E. STĘPNIOWSKA, B. DUBIEL, D. Geiger, G. CEMPURA, J. C. Hernandez, A. CZYRSKA-FILEMONOWICZ // W: 2\textsuperscript{nd} Stanisław Gorczyca Workshop on Electron microscopy: new TEM techniques : 1–4.10.2008, Kraków : proceedings / eds. Beata Dubiel, Elżbieta Stępniowska, Aleksandra Czyrska-Filemonowicz. — Kraków : Wydawnictwo Naukowe „Akapit”, 2008. — Na s. tyt. dod.: ESTEEM – Enabling Science and Technology through European Electron Microscopy. — ISBN: 978-83-60958-23-0. — S. 306–307

Application of analytical electron microscopy and FIB-SEM tomographic technique for phase analysis in as-cast Allvac 718Plus superalloy / Adam KRUK, Grzegorz CEMPURA // International Journal of Materials Research ; ISSN 1862-5282. — Tytuł poprz.: Zeitschrift für Metallkunde. — 2019 vol. 110 iss. 1, s. 3–10. — Bibliogr. s. 9–10. — Publikacja dostępna online od: 2018-07-16. — XVI international conference on Electron microscopy : Jachranka, Poland, September 10th-13th 2017. — tekst: https://www.hanser-elibrary.com/doi/pdf/10.3139/146.111678

Application of analytical electron microscopy and FIB/SEM tomographic technique for phase analysis in as-cast Allvac 718Plus superalloy / A. KRUK, G. CEMPURA // W: XVI International conference on Electron microscopy : 10 – 13 September 2017, Jachranka, Poland : conference program and book of abstracts / Warsaw University of Technology, Polish Society for Microscopy. — [Polska : WUT], [2017]. — S. 52

Application of analytical electron microscopy and tomographic techniques for metrology and 3D imaging of microstructural elements in $Allvac^®$ 718Plus™ / A. KRUK, G. CEMPURA, S. LECH, A. M. Wusatowska-Sarnek, A. CZYRSKA-FILEMONOWICZ // W: Proceedings of the 9th international symposium on superalloy 718 & derivatives: energy, aerospace, and industrial applications / ed. Eric Ott, [et al.]. — Cham : Springer International Publishing AG, 2018. — (The Minerals, Metals & Materials Series ; ISSN 2367-1181). — ISBN: 978-3-319-89479-9 ; e-ISBN: 978-3-319-89480-5. — S. 1035–1050. — Bibliogr. s. 1049–1050, Abstr.. — Toż. na pendrive. — tekst: https://link-1springer-1com-1000048fh01cd.wbg2.bg.agh.edu.pl/content/pdf/10.1007%2F978-3-319-89480-5_69.pdf

Application of EFTEM and FIB electron tomography to 3D visualization and metrology of nanoparticles in Inconel 718 superalloy — Zastosowanie tomografii EFTEM i FIB do przestrzennej wizualizacji i metrologii nanocząstek w nadstopie Inconel 718 / Adam KRUK, Grzegorz CEMPURA, Beata DUBIEL, Aleksandra CZYRSKA-FILEMONOWICZ // Inżynieria Materiałowa ; ISSN 0208-6247. — 2010 R. 31 nr 3, s. 606–609. — Bibliogr. s. 609

Application of electron tomography to 3D visualization of carbonitrides in steel / A. KRUK, W. OSUCH, G. CEMPURA, J. C. Hernandez // W: EM'2008 : XIII international conference on Electron Microscopy : Zakopane, Poland, 8–11 June 2008 : abstracts. — Kraków : Wydawnictwo Naukowe „Akapit”, cop. 2008. — ISBN: 978-83-60958-15-5. — S. 91

Application of electron tomography to analysis of nanoparticles in structural alloys / Grzegorz CEMPURA, Adam KRUK, Beata DUBIEL, Juan C. Hernandes, Aleksandra CZYRSKA-FILEMONOWICZ // W: E-MRS 2009 fall meeting : European Materials Research Society : Warsaw (Poland) : 14th – 18th September, 2009 : scientific programme and book of abstracts / Warsaw University of Technology. — [Polska : s. n.], [2009]. — S. 167

Application of TEM and FIB-SEM tomography for analysis of micro- and nanostructural elements in 718Plus superalloy / A. KRUK, G. CEMPURA, A. CZYRSKA-FILEMONOWICZ // W: Abstract book of 10th Japanese-Polish joint seminar on Micro and nano analysis : advances in microscopy and microanalysis for soft/hard materials : 24–26 October, 2014, Sapporo, Japan / Hokkaido University. Faculty of Engineering. — [Sapporo : Hokkaido University], [2014]. — S. 26–27

Application of transmission electron microscopy and FIB tomography to microstructure characterisation of tungsten based materials / S. Milc, A. KRUK, G. CEMPURA, H. J. Penkalla, A. CZYRSKA-FILEMONOWICZ // W: PFMC-13 / FEMaS-1 [Dokument elektroniczny] : 13\textsuperscript{th} international workshop on Plasma-facing materials and components for fusion applications and 1\textsuperscript{st} international conference on Fusion energy materials science : Rosenheim 9–13 May 2011 : book of abstracts. — Wersja do Windows. — Dane tekstowe. — [Rosenheim? : s. n.], [2011]. — Dane na dysku Flash. — S. 184. — Wymagania systemowe: Adobe Acrobat Reader. — Bibliogr. s. 184

Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials / S. Milc, A. KRUK, G. CEMPURA, H. J. Penkalla, C. Thomsser, A. CZYRSKA-FILEMONOWICZ // Physica Scripta ; ISSN 0031-8949. — 2011 T145, s. 1–4 [numeracja całości nieciągła]. — Bibliogr. s. 4, Abstr.. — Numer konferencyjny, wydany poza numeracją ciągłą czasopisma. — 13th international workshop on Plasma-facing materials and components for fusion applications/1st international conference on Fusion energy materials science : 9–13 May 2011, Rosenheim, Germany. — tekst: http://iopscience.iop.org/1402-4896/2011/T145/014043/pdf/physscr11_T145_014043.pdf

Characterisation of $\gamma$' and $\gamma$” strengthening particles in Inconel 718 superalloy by Electron Microscopy and FIB Tomography / A. CZYRSKA-FILEMONOWICZ, A. KRUK, B. DUBIEL, G. CEMPURA // W: IMC17 [Dokument elektroniczny] : International Microscopy Congress : Rio, Brazil, 19–24 September, 2010 : proceedings. — Wersja do Windows. — Dane tekstowe. — [Brazil : Sociedade Brasileira de Microscopia et Microanálise], [cop. 2010]. — 1 dysk optyczny. — S. [1–2]. — Wymagania systemowe: Adobe Acrobat Reader ; napęd CD-ROM. — Bibliogr. s. [1–2]

Characterisation of $TiB_{2}$ nanocrystalline coating on the $Cr-Ni-Mo$ austenitic steel — Charakterystyka nanokrystalicznej powłoki $TiB_{2}$ na stali austenitycznej $Cr-Ni-Mo$ / Tomasz MOSKALEWICZ, Grzegorz CEMPURA, Marcin KOT, František Lofaj, Aleksandra CZYRSKA-FILEMONOWICZ // Inżynieria Materiałowa ; ISSN 0208-6247. — 2011 R. 32 nr 4, s. 600–603. — Bibliogr. s. 603, Streszcz., Abstr.

Characteristics of Al203 layers formed on aluminum alloys by plasma electrolytic oxidation / Mateusz JĘDRUSIK, Grzegorz CEMPURA // W: The 5\textsuperscript{th} Stanisław Gorczyca European school on Electron microscopy and electron tomography : Kraków, 5-8.07.2016 : proceedings / ed. by G. Cempura, A. Gruszczyński, A. Czyrska-Filemonowicz ; AGH University of Science and Technology, International Centre of Electron Microscopy for Materials Science, Faculty of Metals Engineering and Industrial Computer Science. — Kraków : AGH University of Science and Technology, 2016. — Opis częśc. wg okł.. — ISBN: 978-83-63663-81-0. — S. 398–399. — Bibliogr. s. 398–399

Characteristics of multi-layer coatings synthesized on Ti6Al4V alloy by micro-arc oxidation in silver nitrate added electrolytes / Faiz Muhaffel, Grzegorz CEMPURA, Meryem Menekse, Aleksandra CZYRSKA-FILEMONOWICZ, Nevin Karaguler, Huseyin Cimenoglu // Surface and Coatings Technology ; ISSN 0257-8972. — 2016 vol. 307 pt. A, s. 308–315. — Bibliogr. s. 315, Abstr.. — Publikacja dostępna online od: 2016-09-01. — tekst: https://goo.gl/Ffa9ze

Characterization of complex coatings deposited by micro-arc oxidation on Ti6Al7Nb alloy / Joanna KARBOWNICZEK, G. CEMPURA, F. Muhaffel, H. Cimenoglu, A. CZYRSKA-FILEMONOWICZ // W: REDEOR : Unified Scientific Approaches Towards Regenerative Orthopaedics and Dentistry : international conference : 25–27 March 2015, Venice, Italy : conference book. — [Italy : s. n.], [2015]. — S. 48–49

Characterization of gold rich nanostructures on AIII-BV semiconductor surfaces by electron microscopy and machine learning techniques / B. R. Jany, A. Janas, W. Piskorz, K. Szajna, A. KRYSHTAL, G. CEMPURA, P. Indyka, A. KRUK, A. CZYRSKA-FILEMONOWICZ, F. Krok // W: MC 2019 [Dokument elektroniczny] : Microscopy Conference : 1–5 September 2019, Berlin, Germany : abstracts. — Wersja do Windows. — Dane tekstowe. — [Berlin : s. n.], [2019]. — S. 303–304. — Wymagania systemowe: Adobe Reader. — Tryb dostępu: https://www.microscopy-conference.de/fileadmin/congress/media/mc2019/druckelemente/MC2019_Proceedings.pdf [2019-10-04]. — Bibliogr. s. 303

Characterization of rapidly solidified $Al-Mg-Sc$ alloys with Li addition / T. Gancarz, A. Dobosz, A. -A. Bogno, G. CEMPURA, N. Schell, R. Chulist, H. Henein // Materials Characterization : an International Journal on Materials Structure and Behavior ; ISSN 1044-5803. — 2021 vol. 178 art. no. 111290, s. 1-8. — Bibliogr. s. 7-8, Abstr.. — Publikacja dostępna online od: 2021-07-01. — tekst: https://www-1sciencedirect-1com-10000278n0032.wbg2.bg.agh.edu.pl/science/article/pii/S1044580321004125/pdfft?md5=6349d8834a08cac19821461483c267bb&pid=1-s2.0-S1044580321004125-main.pdf

Characterization of the $\gamma$-TiAl microstructure by analytical electron microscopy / G. CEMPURA, B. DUBIEL, A. CZYRSKA-FILEMONOWICZ // W: 5\textsuperscript{th} Polish-Japanese symposium on Advanced methods of materials characterization : 29. 08.–2. 09. 2004 Niedzica, Poland : programme and abstracts. — [Kraków : Polish Academy Of Science. Institute of Metallurgy and Materials Science], [2004]. — S. 12–14. — Bibliogr. s. 14

Characterization of the porous coatings with incorporated silver deposited by micro-arc oxidation : poster / KARBOWNICZEK J., CEMPURA G., Muhaffel F., Cimenoglu H., Kayali S., CZYRSKA-FILEMONOWICZ A. // W: IMC 2014 [Dokument elektroniczny] : 18\textsuperscript{th} International Microscopy Congress : Microscopy for global challenges touching atoms, molecules, nanostructures and cells by multidimensional microscopy : Prague, 7–12 September 2014 : proceedings / ed. Pavel Hozak. — Wersja do Windows. — Dane tekstowe. — [Czech Republic : Czechoslovak Microscopy Society], cop. 2014. — Dysk Flash. — Opis częśc. wg okł.. — S. [1–2], poz. ID-13-P-2298. — Wymagania systemowe: Adobe Reader. — Tytuł przejęto ze strony tytułowej (po wybraniu opcji poz. 2298)

Characterization of ZnAl cast alloys with Li addition / Tomasz GANCARZ, Grzegorz CEMPURA // Materials and Design ; ISSN 0264-1275. — Tytuł poprz.: Materials in Engineering ; ISSN: 0261-3069. — 2016 vol. 104, s. 51–59. — Bibliogr. s. 59, Abstr.. — Publikacja dostępna online od: 2016-05-10. — tekst: https://goo.gl/0f3CMl

Characterization of ZnAl cast alloys with Na addition / Tomasz Gancarz, Grzegorz CEMPURA, Wojciech Skuza // Materials Characterization : an International Journal on Materials Structure and Behavior ; ISSN 1044-5803. — 2016 vol. 111, s. 147–153. — Bibliogr. s. 153, Abstr.. — Publikacja dostępna online od: 2015-11-30. — tekst: https://goo.gl/EpZqq0