Wykaz publikacji wybranego autora

Aimo Winkelmann, dr hab.

profesor nadzwyczajny

Akademickie Centrum Materiałów i Nanotechnologii
ACMIN-zim, Zakład Inżynierii Materiałowej

  • 2019

    [dyscyplina 1] dziedzina nauk inżynieryjno-technicznych / inżynieria materiałowa

Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: 0000-0002-6534-693X orcid iD

ResearcherID: E-8606-2010

Scopus: 6701442404

PBN: 5e7094f9878c28a0473c82b0

System Informacyjny AGH (SkOs)

1
  • About the reliability of EBSD measurements: data enhancement
2
  • Absolute structure from scanning electron microscopy
3
  • Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
4
  • Approximant-based orientation determination of quasicrystals using electron backscatter diffraction
5
  • EBSD orientation analysis based on experimental Kikuchi reference patterns
6
  • Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction
7
  • Improving EBSD precision by orientation refinement with full pattern matching
8
  • Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns
9
  • Refined calibration model for improving the orientation precision of electron backscatter diffraction maps
10
  • Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope