Wykaz publikacji wybranego autora

Aimo Winkelmann, dr hab.

profesor nadzwyczajny

Akademickie Centrum Materiałów i Nanotechnologii
ACMIN-zim, Zakład Inżynierii Materiałowej

  • 2019

    [dyscyplina 1] dziedzina nauk inżynieryjno-technicznych / inżynieria materiałowa

Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: 0000-0002-6534-693X orcid iD

ResearcherID: E-8606-2010

Scopus: 6701442404

PBN: 5e7094f9878c28a0473c82b0

System Informacyjny AGH (SkOs)

1
  • Absolute structure from scanning electron microscopy
2
  • Active sites of Te-hyperdoped silicon by hard x-ray photoelectron spectroscopy
3
  • Approximant-based orientation determination of quasicrystals using electron backscatter diffraction
4
  • Assignment of chiral elemental crystal structures using Kikuchi diffraction
5
  • Assignment of enantiomorphs for the chiral allotrope $\beta-Mn$ by diffraction methods
6
  • Bulk spin polarization of magnetite from spin-resolved hard x-ray photoelectron spectroscopy
7
  • Circular dichroism in hard X-ray photoelectron diffraction observed by time-of-flight momentum microscopy
8
  • Correlating crystallographic orientation and ferroic properties of twin domains in metal halide perovskites
9
  • Correlation of heterogeneous local martensite tetragonality and carbon distribution in high carbon steel
10
  • Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns
11
12
  • Early martensitic transformation in a 0.74C–1.15Mn–1.08Cr high carbon steel
13
  • EBSD orientation analysis based on experimental Kikuchi reference patterns
14
  • Effects of multiple elastic and inelastic scattering on energy-resolved contrast in Kikuchi diffraction
15
  • Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction
16
  • Enantiomorph conversion in single crystals of the Weyl semimetal CoSi
17
  • Evolution of martensite tetragonality in high-carbon steels revealed by \emph{in situ} high-energy X-ray diffraction
18
  • Factors affecting martensite tetragonality during EBSD analysis
19
  • Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction
20
  • Improving EBSD precision by orientation refinement with full pattern matching
21
  • Kikuchi pattern simulations of backscattered and transmitted electrons
22
  • Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns
23
24
  • Refined calibration model for improving the orientation precision of electron backscatter diffraction maps
25
  • Site-specific atomic order and band structure tailoring in the diluted magnetic semiconductor (In,Ga,Mn)As