doktorant
Faculty of Metals Engineering and Industrial Computer Science WIMiIP-kmm
ORCID: brak
ResearcherID: brak
Scopus: brak
OPI Nauka Polska
Three-dimensional visualization and metrology of nanoparticles in Inconel 718 by electron tomography / Krzysztof KULAWIK, Adam KRUK, Beata DUBIEL, Aleksandra CZYRSKA-FILEMONOWICZ // Diffusion and Defect Data – Solid State Data. Part B, Solid State Phenomena ; ISSN 1012-0394. — 2012 vol. 186, s. 45–48. — Bibliogr. s. 48, Abstr.. — Electron Microscopy XIV : selected peer reviewed papers from the XIV international conference on Electron Microscopy (EM 2011) : June 26–30, 2011, Wisla, Poland / ed. Danuta Stróż, Krystian Prusik. — Durnten-Zurich : Trans Tech Publications Ltd, cop. 2012. — ISBN-13 978-3-03785-381-8. — tekst: http://www.scientific.net/SSP.186.45.pdf
keywords: electron tomography, nano particles, Inconel 718, FIB tomography
Zobacz pełny wykaz publikacji Autora/Autorów: Aleksandra Czyrska-Filemonowicz, Beata Dubiel, Adam Kruk
cyfrowy identyfikator dokumentu: 10.4028/www.scientific.net/SSP.186.45