profesor nadzwyczajny
Wydział Fizyki i Informatyki Stosowanej WFiIS-kis, Katedra Informatyki Stosowanej i Fizyki Komputerowej
ORCID: brak
ResearcherID: F-9777-2010
Scopus: brak
A new algorithm for rotation detection in iris pattern recognition / Krzysztof MISZTAL, Jacek Tabor, Khalid SAEED // W: Computer Information Systems and Industrial Management : 11th IFIP TC 8 international conference, CISIM 2012 : Venice, Italy, September 26–28, 2012 : proceedings / eds. Agostino Cortesi, [et al.]. — Heidelberg [etc.] : Springer, cop. 2012. — (Lecture Notes in Computer Science ; ISSN 0302-9743 ; LNCS 7564. Information Systems and Applications, incl. Internet/Web, and HCI). — ISBN: 978-3-642-33259-3 ; e-ISBN: 978-3-642-33260-9. — S. 135–145. — Bibliogr. s. 145, Abstr.. — K. Misztal: dod. afiliacja: Jagiellonian University; w bazie Web of Science ISBN: 978-3-642-33260-9
A study on touch screen devices: user authentication problems / Marcin Rogowski, Khalid SAEED // W: Biometrics and kansei engineering / eds. Khalid Saeed, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — ISBN: 978-1-4614-5607-0. — S. 89–111. — Bibliogr. s. 109–111, Abstr.
Advances in the Keystroke Dynamics: the practical impact of database quality / Mariusz Rybnik, Piotr PANASIUK, Khalid SAEED, Marcin Rogowski // W: Computer Information Systems and Industrial Management : 11th IFIP TC 8 international conference, CISIM 2012 : Venice, Italy, September 26–28, 2012 : proceedings / eds. Agostino Cortesi, [et al.]. — Heidelberg [etc.] : Springer, cop. 2012. — (Lecture Notes in Computer Science ; ISSN 0302-9743 ; LNCS 7564. Information Systems and Applications, incl. Internet/Web, and HCI). — ISBN: 978-3-642-33259-3 ; e-ISBN: 978-3-642-33260-9. — S. 203–214. — Bibliogr. s. 213–214, Abstr.. — W bazie Web of Science brak afiliacji AGH
Biometrics and kansei engineering / eds. Khalid SAEED, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — 275 s.. — Bibliogr. przy rozdz.. — ISBN: 978-1-4614-5607-0
Biometrics image denoising algorithm based on contourlet transform / Monika Godzwon, Khalid SAEED // W: Computer Vision and Graphics : International Conference, ICCVG 2012 : Warsaw, Poland, September 24–26, 2012 : proceedings / eds. Leonard Bolc [et al.]. — Berlin ; Heidelberg : Springer-Verlag, cop. 2012. — (Lecture Notes in Computer Science ; ISSN 0302-9743 ; LNCS 7594. Image Processing, Computer Vision, Pattern Recognition, and Graphics). — ISBN: 978-3-642-33563-1 ; e-ISBN: 978-3-642-33564-8. — S. 735–742. — Bibliogr. s. 741–742, Abstr.
Biometrics principles and important concerns / Khalid SAEED // W: Biometrics and kansei engineering / eds. Khalid Saeed, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — ISBN: 978-1-4614-5607-0. — S. 3–20. — Bibliogr. 19–20, Abstr.
Computer information systems and industrial management : 11th IFIP TC 8 international conference, CISIM 2012 : Venice, Italy, September 26–28, 2012 : proceedings / eds. Agostino Cortesi, Nabendu Chaki, Khalid SAEED, Sławomir Wierzchoń ; IFIP International Federation for Information Processing. — Heidelberg : Springer, cop. 2012. — XII, 444 s.. — (Lecture Notes in Computer Science ; ISSN 0302-9743 ; LNCS 7564. Information Systems and Applications, incl. Internet/Web, and HCI). — Bibliogr. przy rozdz., Indeks. — ISBN: 978-3-642-33259-3 ; e-ISBN: 978-3-642-33260-9
Face recognition in unconstrained environment / Przemysław KOCJAN, Khalid SAEED // W: Biometrics and kansei engineering / eds. Khalid Saeed, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — ISBN: 978-1-4614-5607-0. — S. 21–42. — Bibliogr. s. 39–42, Abstr.
Human identification by vascular patterns / Jan Kosmala, Khalid SAEED // W: Biometrics and kansei engineering / eds. Khalid Saeed, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — ISBN: 978-1-4614-5607-0. — S. 67–87. — Bibliogr. s. 86–87, Abstr.
International Journal of Biometrics ; ISSN 1755-8301 / ed.-in-chief Khalid SAEED. — UK : Inderscience Enterprises Ltd, 2012. — vol. 4 nr 1, 3, 4
Iris pattern recognition with a new mathematical model to its rotation detection / Krzysztof MISZTAL, Emil Saeed, Jacek Tabor, Khalid SAEED // W: Biometrics and kansei engineering / eds. Khalid Saeed, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — ISBN: 978-1-4614-5607-0. — S. 43–65. — Bibliogr. s. 63–65, Abstr.
Preface / Khalid SAEED // International Journal of Biometrics ; ISSN 1755-8301. — 2012 vol. 4 no. 2, s. 103–105
Preface / Khalid SAEED // W: Biometrics and kansei engineering / eds. Khalid Saeed, Tomomasa Nagashima. — New York [etc.] : Springer, cop. 2012. — ISBN: 978-1-4614-5607-0. — S. V–VII