adiunkt
Faculty of Physics and Applied Computer Science WFiIS-kod
ORCID: brak
ResearcherID: brak
Scopus: brak
OPI Nauka Polska
ASIC wafer test system for the ATLAS Semiconductor Tracker front-end chip / F. Anghinolfi, W. BIAŁAS, [et al.] // IEEE Transactions on Nuclear Science ; ISSN 0018-9499. — 2002 vol. 49 no. 3 pt. 2 art. no. PII S0018-9499(20)06127-0, s. 1080–1085. — Bibliogr. s. 1085, Abstr.. — IEEE Nuclear Science Symposium : San Diego, California, November 04-10, 2001. — tekst: https://ieeexplore-1ieee-1org-1000047fr020a.wbg2.bg.agh.edu.pl/stamp/stamp.jsp?tp=&arnumber=1039618