A chip removal facility for indium bump bonded pixel detectors / A. Airoldi, [et al.], W. KUCEWICZ, [et al.] // Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, spectrometers, detectors and associated equipment ; ISSN 0168-9002. — 2005 vol. 540 iss. 2–3, s. 259–265. — Bibliogr. s. 265, Abstr.. — tekst: https://www-1sciencedirect-1com-10000271y08d6.wbg2.bg.agh.edu.pl/science/article/pii/S0168900204024246/pdfft?md5=c2463018b2bae2fa9f22ac586ca523db&pid=1-s2.0-S0168900204024246-main.pdf

Data acquisition system for silicon ultra fast cameras for electron and gamma sources in medical applications / M. JASTRZĄB, W. KUCEWICZ, H. NIEMIEC, M. SAPOR [et al.] // W: MIXDES 2005 : MIXed DESign of integrated circuits and systems : proceedings of the 12\textsuperscript{th} international conference : Kraków, Poland 22–25 June 2004, Vol. 1 of 2 / ed. Andrzej Napieralski. — [Łodź : Technical University. Department of Microelectronics and Computer Science], 2005. — S. 601–604. — Bibliogr. s. 604, Abstr.

Design, fabrication and characterization of SOI pixel detectors of ionizing radiation / D. Tomaszewski [et al.], M. KOZIEŁ, W. KUCEWICZ, [et al.], S. KUTA, [et al.], H. NIEMIEC, M. SAPOR, M. SZELEŹNIAK // W: Science and technology of semiconductor on Insulator structures devices operating in a harsh environment [Dokument elektroniczny] : proceedings of the NATO Advanced Research Workshop : Kiev, Ukraine, 26–30 April 2004 / eds. Flandre Denis [et al.]. — Wersja do Windows. — Dane tekstowe. — Netherlands : Kluwer Academic Publishers, 2005. — (NATO Science Series. Series II: Mathematics, Physics and Chemistry ; ISSN 1568-2609 ; vol. 185). — ISBN10: 1-4020-3011-8. — S. 291–296. — Bibliogr. ekran 296, Abstr.. — Tyt. przejęto z ekranu tytułowego. — tekst: https://goo.gl/QJtj2n

Development of monolithic active pixel detector in SOI technology / W. KUCEWICZ, A. Bulgheroni [et al.], H. NIEMIEC // Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, spectrometers, detectors and associated equipment ; ISSN 0168-9002. — 2005 vol. 541 iss. 1–2, s. 172–177. — Bibliogr. s. 176–177, Abstr.. — tekst: https://www-1sciencedirect-1com-1000027az0290.wbg2.bg.agh.edu.pl/science/article/pii/S0168900205000665/pdfft?md5=63006a2e72c73ce64da526054e7a6be7&pid=1-s2.0-S0168900205000665-main.pdf

Monolithic active pixel sensor realized in SOI technology – concept and verification / H. NIEMIEC, [et al.], M. JASTRZĄB, W. KUCEWICZ, [et al.], S. KUTA, [et al.], M. SAPOR, [et al.] // Microelectronics Reliability ; ISSN 0026-2714. — 2005 vol. 45 iss. 7–8, s. 1202–1207. — Bibliogr. s. 1206–1207, Abstr.. — tekst: https://www-1sciencedirect-1com-1000027l00293.wbg2.bg.agh.edu.pl/science/article/pii/S0026271404004172/pdfft?md5=d2ae14d79598be95d26527995c655ec5&pid=1-s2.0-S0026271404004172-main.pdf

Monolithic silicon pixel detectors in SOI technology / J. Marczewski, [et al.], M. KOZIEŁ, W. KUCEWICZ, [et al.], S. KUTA, H. NIEMIEC, M. SAPOR, M. SZELEŹNIAK, [et al.] // Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, spectrometers, detectors and associated equipment ; ISSN 0168-9002. — 2005 vol. 549 iss. 1–3, s. 112–116. — Bibliogr. s. 116, Abstr.. — VERTEX 2003 : 12th International Workshop on Vertex Detectors Low Wood : 14–19 September 2003, Lake Windermere, England. — tekst: https://www-1sciencedirect-1com-1000027l002a1.wbg2.bg.agh.edu.pl/science/article/pii/S0168900205009757/pdfft?md5=dcb546d9624571bfffdca7484021294b&pid=1-s2.0-S0168900205009757-main.pdf

Status of the SOI detector R&D / A. Bulgheroni, M. Caccia, C. Cappellini, M. JASTRZĄB, M. KOZIEŁ, W. KUCEWICZ, H. NIEMIEC, M. SAPOR, P. Grabiec, K. Kucharski, J. Marczewski, D. Tomaszewski // W: LCWS 05 : 2005 Ineternational Linear Collider Workshop : Stanford, California, USA, 18–22 March 2005. — [Stanford : s. n.], [2005]. — S. [1–3] 0812. — Bibliogr. s. [3]

System for noise parameterization of MOS devices / M. KOZIEŁ, T. Klatka, W. KUCEWICZ, H. NIEMIEC // W: MIXDES 2005 : MIXed DESign of integrated circuits and systems : proceedings of the 12\textsuperscript{th} international conference : Kraków, Poland 22–25 June 2004, Vol. 1 of 2 / ed. Andrzej Napieralski. — [Łodź : Technical University. Department of Microelectronics and Computer Science], 2005. — S. 365–370. — Bibliogr. s. 370, Abstr.

TSSOI as an efficient tool for diagnostics of SOI technology in Institute of Electron Technology / Mateusz Barański, [et al.], Wojciech KUCEWICZ, [et al.], Halina NIEMIEC, Maria SAPOR, [et al.] // Journal of Telecommunications and Information Technology ; ISSN 1509-4553. — 2005 no. 1, s. 85–93. — Bibliogr. s. 91, Abstr.. — tekst: https://www.itl.waw.pl/czasopisma/JTIT/2005/1/85.pdf