Wykaz publikacji wybranego autora

Adrian Oponowicz, mgr

doktorant

Wydział Fizyki i Informatyki Stosowanej
WFiIS-kfms, Katedra Fizyki Materii Skondensowanej

Identyfikatory Autora

ORCID: brak

ResearcherID: brak

Scopus: 57202432582

Liczba pozycji spełniających powyższe kryteria selekcji: 13, z ogólnej liczby 15 publikacji Autora

1
  • A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
2
  • A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing
3
  • Determination of depth-dependent stress profile in the near surface region of mechanically treated samples
4
  • Determining of residual stresses in mechanically textured and polished austenitic stainless steel using synchrotron diffraction
5
  • Evolution of stresses and elastic properties below sample surface studied using X-ray diffraction
6
  • Gradient of residual stress and lattice parameter in mechanically polished tungsten measured using classical X-rays and synchrotron radiation
7
  • In-depth evolution of residual stresses and effect of free surface on stress relaxation determined using X-ray diffraction Laplace methods
8
  • Measurement of stresses in polycrystalline materials using energy-dispersive X-ray diffraction
9
  • Multi-reflection energy dispersive diffraction applied to measure stresses in surface layers
10
  • Multireflection grazing-incidence X-ray diffraction: a new approach to experimental data analysis
11
  • New analysis method of multireflection grazing incidence X-ray diffraction
12
  • Saccharine effect on the microstructure and stress state in nickel electrodeposited on copper substrate
13
  • Synchrotron energy dispersive method and grazing incident X-ray diffraction used to measure stresses in surface layers of polycrystalline materials