Wykaz publikacji wybranego autora

Aimo Winkelmann, dr hab.

profesor nadzwyczajny

Akademickie Centrum Materiałów i Nanotechnologii
ACMiN, Akademickie Centrum Materiałów i Nanotechnologii


  • 2019

    [dyscyplina 1] dziedzina nauk inżynieryjno-technicznych / inżynieria materiałowa


Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: 0000-0002-6534-693X orcid iD

ResearcherID: E-8606-2010

Scopus: 6701442404

PBN: 5e7094f9878c28a0473c82b0

System Informacyjny AGH (SkOs)





Liczba pozycji spełniających powyższe kryteria selekcji: 32, z ogólnej liczby 36 publikacji Autora


1
  • 3D Active sites of Te in hyperdoped Si by hard X-ray photoelectron Kikuchi-diffraction
2
  • About the reliability of EBSD measurements: data enhancement
3
  • Absolute structure from scanning electron microscopy
4
  • Adaptive phase or variant formation in modulated $Ni-Mn-Ga$ martensite?
5
  • Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
6
  • Approximant-based orientation determination of quasicrystals using electron backscatter diffraction
7
  • Assignment of enantiomorphs for the chiral allotrope $\beta-Mn$ by diffraction methods
8
  • Bulk spin polarization of magnetite from spin-resolved hard x-ray photoelectron spectroscopy
9
  • Correlating crystallographic orientation and ferroic properties of twin domains in metal halide perovskites
10
  • Correlation of heterogeneous local martensite tetragonality and carbon distribution in high carbon steel
11
  • Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns
12
13
  • Early martensitic transformation in a 0.74C–1.15Mn–1.08Cr high carbon steel
14
  • EBSD orientation analysis based on experimental Kikuchi reference patterns
15
  • Effects of multiple elastic and inelastic scattering on energy-resolved contrast in Kikuchi diffraction
16
  • Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction
17
  • Improving EBSD precision by orientation refinement with full pattern matching
18
  • Investigation of EBSD post-processing techniques for aluminium-nitride thin films grown on nano-patterned sapphire
19
  • Kikuchi pattern simulations of backscattered and transmitted electrons
20
  • Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns
21
  • Methods for quasicrystals analysis using EBSD
22
  • Quantitative orientation data from thin film GaN using virtual diode and centre of mass imaging
23
  • Quasicrystal orientation determination using EBSD
24
  • Recent advances in EBSD
25
  • Refined calibration model for improving the orientation precision of electron backscatter diffraction maps