Argon cluster ion beam depth profiling of organic materials by X-ray photoelectron spectroscopy / Andrzej BERNASIK, Mateusz M. MARZEC, Wojciech ŁUŻNY, Jakub Rysz, Andrzej Budkowski // W: WOREN 2013 : 3\textsuperscript{rd} Polish-French workshop on Organic electronics and nanophotonics : Muszyna–Złockie, 17–21 February 2013 : book of abstracts / ed.-in-chief Jacek Nizioł, eds. Ewa Gondek, Monika Pokladko-Kowar. — Kraków : Faculty of Physics and Applied Computer Science. AGH University of Science and Technology, 2013. — ISBN: 978-83-925779-4-2. — S. 9. — Bibliogr. s. 9

Argon gas cluster ion beam in XPS analysis of poly(3-alkylthiophene)s / A. BERNASIK, M. M. MARZEC, J. Rysz, W. ŁUŻNY, A. Budkowski // W: ECASIA'13 : 15th European conference on Applications of surface and interface analysis : 13\textsuperscript{th} – 18\textsuperscript{th} October 2013 Cagliari, Sardinia (Italy) / ed. A. Rossi, B. Elsener ; Dipartimento di Scienze Chimiche e Geologiche Università di Cagliari, Sardinia, Italy. — [Cagliari : s. n.], [2013]. — ISBN: 978-88-907670-0-5. — S. 80

Buried polymer/metal interfaces examined with Kelvin Probe Force Microscopy / M. M. MARZEC, K. Awsiuk, A. BERNASIK, J. Rysz, J. HABERKO, W. ŁUŻNY, A. Budkowski // Thin Solid Films ; ISSN 0040-6090. — 2013 vol. 531, s. 271–276. — Bibliogr. s. 276, Abstr.. — tekst: http://ac.els-cdn.com/S0040609013001776/1-s2.0-S0040609013001776-main.pdf?_tid=93723c98-19e0-11e3-9c86-00000aab0f6b&acdnat=1378793988_2ee66cce3197c49d639207abb6cf38de

Characterization of silicon biosensor surfaces with Time of Flight Secondary Ion Mass Spectroscopy / J. Rysz, K. Awsiuk, K. Fornal, P. Petrou, A. Budkowski, A. BERNASIK, S. Kakabakos, M. M. MARZEC, I. Raptis // W: SIMS-19 : the 19th international conference on Secondary Ion Mass Spectrometry : September 29–October 4, 2013, ICC Jeju, Jeju, Korea : program and abstracts. — [Korea : s. n.], 2013. — Dodatkowo na okł.: Balances between dynamic SIMS and static SIMS, Academia and Industries, Fundamentals and Applications. — S. 147. — Bibliogr. s. 147

Dipole-dipole interactions at buried polymer/metal interfaces examined with Kelvin Probe Force Microscopy and Secondary Ion Mass Spectrometry / M. M. MARZEC, A. BERNASIK, J. Rysz, W. ŁUŻNY, A. Budkowski // W: SIMS-19 : the 19th international conference on Secondary Ion Mass Spectrometry : September 29–October 4, 2013, ICC Jeju, Jeju, Korea : program and abstracts. — [Korea : s. n.], 2013. — Dodatkowo na okł.: Balances between dynamic SIMS and static SIMS, Academia and Industries, Fundamentals and Applications. — S. 155. — Bibliogr. s. 155

Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry / M. M. MARZEC, A. BERNASIK, J. Rysz, W. ŁUŻNY, A. Budkowski // Electrochimica Acta : Journal of the International Society of Electrochemistry ; ISSN 0013-4686. — 2013 vol. 104, s. 462–467. — Bibliogr. s. 466–467, Abstr.. — ISSIS : 3rd International Symposium on Surface Imaging/Spectroscopy at the Solid/Liquid Interface : May 27–June 01, 2012, Krakow, Poland. — tekst: http://ac.els-cdn.com/S0013468613003733/1-s2.0-S0013468613003733-main.pdf?_tid=4f13ab26-19e1-11e3-a48b-00000aab0f01&acdnat=1378794303_002fdd3e5904775891fcb5ce428768bb

Examination of self-assembled monolayers influence on polymer/metal interfaces by KPFM and SIMS / Mateusz MARZEC // W: Proceedings of the ISD workshops : [Szczyrk, from 9\textsuperscript{th} till 15\textsuperscript{th} June 2013] / eds. Marcin Perzanowski [et al.] ; AGH University of Science and Technology. Faculty of Physics and Applied Computer Science. — Kraków : FPACS AGH UST, 2013. — ISBN: 978-83-925779-3-5. — S. 235–238. — Bibliogr. s. 238

Model immunoassay on silicon surfaces: vertical and lateral nanostructure vs. protein coverage / K. Awsiuk, A. Budkowski, P. Petrou, A. BERNASIK, M. M. MARZEC, S. Kakabakos, J. Rysz, I. Raptis // Colloids and Surfaces. B, Biointerfaces ; ISSN 0927-7765. — 2013 vol. 103, s. 253–260. — Bibliogr. s. 260, Abstr.. — tekst: http://ac.els-cdn.com/S0927776512006042/1-s2.0-S0927776512006042-main.pdf?_tid=7ccb651c-19e2-11e3-8b58-00000aacb362&acdnat=1378794809_bd14d40d122158acfb8b7b1816d1690c

Organic thin films depth profiling with large $Ar_{n}^{+}$ cluster ion beam by X-ray photoelectron spectroscopy / Mateusz M. MARZEC, Andrzej BERNASIK, Jakub Rysz, Wojciech ŁUŻNY, Andrzej Budkowski // W: WOREN 2013 : 3\textsuperscript{rd} Polish-French workshop on Organic electronics and nanophotonics : Muszyna–Złockie, 17–21 February 2013 : book of abstracts / ed.-in-chief Jacek Nizioł, eds. Ewa Gondek, Monika Pokladko-Kowar. — Kraków : Faculty of Physics and Applied Computer Science. AGH University of Science and Technology, 2013. — ISBN: 978-83-925779-4-2. — S. 113

Pattern replication in blends of semiconducting and insulating polymers casted by horizontal dipping / Jakub Rysz, Monika Josiek, Mateusz M. MARZEC, Ellen Moons // Journal of Polymer Science. Part B, Polymer Physics ; ISSN 0887-6266. — 2013 vol. 51 iss. 19, s. 1419–1426. — Bibliogr. s. 1425–1426, Abstr.. — tekst: http://onlinelibrary.wiley.com/doi/10.1002/polb.23354/pdf

Self-assembled monolayers influence on polymer/metal interfaces examined by means of Kelvin Probe Force Microscopy and secondary ion mass spectrometry / Mateusz M. MARZEC, Andrzej BERNASIK, Jakub Rysz, Wojciech ŁUŻNY, Andrzej Budkowski // W: WOREN 2013 : 3\textsuperscript{rd} Polish-French workshop on Organic electronics and nanophotonics : Muszyna–Złockie, 17–21 February 2013 : book of abstracts / ed.-in-chief Jacek Nizioł, eds. Ewa Gondek, Monika Pokladko-Kowar. — Kraków : Faculty of Physics and Applied Computer Science. AGH University of Science and Technology, 2013. — ISBN: 978-83-925779-4-2. — S. 79