Design and noise analysis of charge sensitive amplifier for readout of pixelized thin film amorphous silicon sensors / K. PÓŁTORAK, W. DĄBROWSKI, P. Jarron, J. Kaplon // W: 2008 IEEE NSS/MIC/RTSD conference record [Dokument elektroniczny] : Nuclear Science Symposium (NSS) ; Medical Imaging Conference (MIC) ; 16th international workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors (RTSD) : 19–25 October 2008 Dresden, Germany / guest ed. Paul Sellin ; Nuclear & Plasma Sciences Society, Institute of Electrical and Electronics Engineers. — Wersja do Windows. — Dane tekstowe. — [New York] : IEEE, 2008. — 1 dysk optyczny. — (IEEE conference record – Nuclear Science Symposium & Medical Imaging Conference ; ISSN 1082-3654). — e-ISBN: 978-1-4244-2715-4. — S. 2946–2951. — Wymagania systemowe: Adobe Acrobat Reader ; napęd CD-ROM. — Bibliogr. s. 2950, Abstr.. — Tyt. przejęto z ekranu tytułowego