Wykaz publikacji wybranego autora

Grzegorz Cempura, dr inż.

adiunkt

Wydział Inżynierii Metali i Informatyki Przemysłowej
WIMiIP-kmm, Katedra Metaloznawstwa i Metalurgii Proszków

[dyscyplina wiodąca] dziedzina nauk inżynieryjno-technicznych / inżynieria materiałowa


[poprzednia klasyfikacja] obszar nauk technicznych / dziedzina nauk technicznych / inżynieria materiałowa


Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: 0000-0002-1875-1588

ResearcherID: brak

Scopus: 55071948300

PBN: 901284

OPI Nauka Polska

System Informacyjny AGH (SkOs)




Opisy publikacji wcześniejszych zobacz: bpp.agh.edu.pl/old.


Liczba pozycji spełniających powyższe kryteria selekcji: 114, z ogólnej liczby 115 publikacji Autora


1
  • 3D characterization and metrology of nanostructures by electron tomography
2
  • 3D characterization and metrology of oxide nanoparticles in ODS alloy by electron tomography
3
  • Analysis of $\gamma$' and $\gamma$” precipitates in nickel-base superalloy inconel 718 using HRTEM and 3D visualisation methods
4
  • Application of analytical electron microscopy and FIB-SEM tomographic technique for phase analysis in as-cast Allvac 718Plus superalloy
5
  • Application of analytical electron microscopy and FIB/SEM tomographic technique for phase analysis in as-cast Allvac 718Plus superalloy
6
  • Application of analytical electron microscopy and tomographic techniques for metrology and 3D imaging of microstructural elements in $Allvac^®$ 718Plus™
7
  • Application of EFTEM and FIB electron tomography to 3D visualization and metrology of nanoparticles in Inconel 718 superalloy
8
  • Application of electron tomography to 3D visualization of carbonitrides in steel
9
  • Application of electron tomography to analysis of nanoparticles in structural alloys
10
  • Application of TEM and FIB-SEM tomography for analysis of micro- and nanostructural elements in 718Plus superalloy
11
  • Application of transmission electron microscopy and FIB tomography to microstructure characterisation of tungsten based materials
12
  • Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials
13
  • A bottom-up process of self-formation of highly conductive titanium oxide ($TiO$) nanowires on reduced $SrTiO_3$
14
  • Characterisation of $\gamma$' and $\gamma$” strengthening particles in Inconel 718 superalloy by Electron Microscopy and FIB Tomography
15
  • Characterisation of $TiB_{2}$ nanocrystalline coating on the $Cr-Ni-Mo$ austenic steel
16
  • Characteristics of Al203 layers formed on aluminum alloys by plasma electrolytic oxidation
17
  • Characteristics of multi-layer coatings synthesized on Ti6Al4V alloy by micro-arc oxidation in silver nitrate added electrolytes
18
  • Characterization of complex coatings deposited by micro-arc oxidation on Ti6Al7Nb alloy
19
  • Characterization of gold rich nanostructures on AIII-BV semiconductor surfaces by electron microscopy and machine learning techniques
20
  • Characterization of the $\gamma$-TiAl microstructure by analytical electron microscopy
21
  • Characterization of the porous coatings with incorporated silver deposited by micro-arc oxidation
22
  • Characterization of ZnAl cast alloys with Li addition
23
  • Characterization of ZnAl cast alloys with Na addition
24
  • Chemical and structural imaging of gold-rich nanostructures on AIIIBV semiconductors by electron microscopy and machine learning
25
  • Co-deposition of CuO and $Mn_{1.5}Co_{1.5}O_{4}$ powders on Crofer22APU by electrophoretic method: structural, compositional modifications and corrosion properties