3D characterization and metrology of nanostructures by electron tomography / J. C. Hernandez, A. B. Hungria, J. A. Perez-Omil, M. S. Moreno, E. A. Coronado, G. CEMPURA, A. KRUK, P. A. Midgley // Microscopy and Microanalysis ; ISSN 1431-9276. — 2008 vol. 14 iss. 52 Suppl. 2, s. 284–286. — Extended abstract of a paper presented at Microscopy and microanalysis 2008 : Albuquerque, New Mexico, USA, August 3–August 7, 2008. — Cambridge, 2008. — tekst: http://search.proquest.com/docview/220319432/fulltextPDF/A7C1BC67F66248AFPQ/142?accountid=48679

3D characterization and metrology of oxide nanoparticles in ODS alloy by electron tomography / A. KRUK, B. DUBIEL, W. OSUCH, G. CEMPURA, J. C. Hernandez, A. CZYRSKA-FILEMONOWICZ // W: MC 2009 [Dokument elektroniczny] : Microscopy Conference in Graz, Austria : 30 August–4 September 2009 / eds. G. Kothleitner, [et al.]. — Wersja do Windows. — Dane tekstowe. — Graz : Verlag der TU, cop. 2009. — 1 dysk optyczny. — Na dysku optycznym dod.: First joint meeting of Dreiländertagung & Multinational congress on Microscopy. — ISBN: 978-3-85125-062-6. — S. 101–102. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM. — Bibliogr. s. 102. — Toż W: MC 2009 : Microscopy Conference, Graz, Austria, 30 August– 4 September 2009 : first joint meeting of Dreiländertagung & Multinational congress on Microscopy. Vol. 1, Instrumentation and methodology / eds. Gerald Kothleitner, Manfred Leisch. — Graz : Verlag der Technischen Universität : Austrian Society of Electron Microscopy, cop. 2009

Advanced electron microscopy for aeronautics and energy systems : qualitative and quantitative approach / Grzegorz CEMPURA, Adam KRUK // W: EM'2020 [Dokument elektroniczny] : XVII international conference on Electron Microscopy : November 30\textsuperscript{th} - December 2\textsuperscript{nd} 2020, Katowice, Poland : book of abstracts / Silesian University of Technology, Institute of Metallurgy and Materials Science. Polish Academy of Sciences, PTMi. — Wersja do Windows. — Dane tekstowe. — [Poland : Silesian University of Technology], [2020]. — 1 dysk optyczny. — S. 31. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM

Advanced electron microscopy of materials for power generation / Grzegorz CEMPURA, Adam KRUK // W: MODENERLANDS COST ACTION CA20109 : modular energy islands for sustainability and resilience : book of abstracts for the strategic workshop on the energy islands - technical challenges and industrial opportunities : Luxembourg, May 15–16, 2023 / ed. by Carlos Rebelo, [et al.]. — [Brussels : COST European Cooperation in Science & Technology], [2023]. — S. 98

Analysis of $\gamma$' and $\gamma$” precipitates in nickel-base superalloy inconel 718 using HRTEM and 3D visualisation methods : abstract / E. STĘPNIOWSKA, B. DUBIEL, D. Geiger, G. CEMPURA, J. C. Hernandez, A. CZYRSKA-FILEMONOWICZ // W: 2\textsuperscript{nd} Stanisław Gorczyca Workshop on Electron microscopy: new TEM techniques : 1–4.10.2008, Kraków : proceedings / eds. Beata Dubiel, Elżbieta Stępniowska, Aleksandra Czyrska-Filemonowicz. — Kraków : Wydawnictwo Naukowe „Akapit”, 2008. — Na s. tyt. dod.: ESTEEM – Enabling Science and Technology through European Electron Microscopy. — ISBN: 978-83-60958-23-0. — S. 306–307

Application of analytical electron microscopy and FIB/SEM tomographic technique for phase analysis in as-cast Allvac 718Plus superalloy / A. KRUK, G. CEMPURA // W: XVI International conference on Electron microscopy : 10 – 13 September 2017, Jachranka, Poland : conference program and book of abstracts / Warsaw University of Technology, Polish Society for Microscopy. — [Polska : WUT], [2017]. — S. 52

Application of electron tomography to 3D visualization of carbonitrides in steel / A. KRUK, W. OSUCH, G. CEMPURA, J. C. Hernandez // W: EM'2008 : XIII international conference on Electron Microscopy : Zakopane, Poland, 8–11 June 2008 : abstracts. — Kraków : Wydawnictwo Naukowe „Akapit”, cop. 2008. — ISBN: 978-83-60958-15-5. — S. 91

Application of electron tomography to analysis of nanoparticles in structural alloys / Grzegorz CEMPURA, Adam KRUK, Beata DUBIEL, Juan C. Hernandes, Aleksandra CZYRSKA-FILEMONOWICZ // W: E-MRS 2009 fall meeting : European Materials Research Society : Warsaw (Poland) : 14th – 18th September, 2009 : scientific programme and book of abstracts / Warsaw University of Technology. — [Polska : s. n.], [2009]. — S. 167

Application of TEM and FIB-SEM tomography for analysis of micro- and nanostructural elements in 718Plus superalloy / A. KRUK, G. CEMPURA, A. CZYRSKA-FILEMONOWICZ // W: Abstract book of 10th Japanese-Polish joint seminar on Micro and nano analysis : advances in microscopy and microanalysis for soft/hard materials : 24–26 October, 2014, Sapporo, Japan / Hokkaido University. Faculty of Engineering. — [Sapporo : Hokkaido University], [2014]. — S. 26–27

Application of transmission electron microscopy and FIB tomography to microstructure characterisation of tungsten based materials / S. Milc, A. KRUK, G. CEMPURA, H. J. Penkalla, A. CZYRSKA-FILEMONOWICZ // W: PFMC-13 / FEMaS-1 [Dokument elektroniczny] : 13\textsuperscript{th} international workshop on Plasma-facing materials and components for fusion applications and 1\textsuperscript{st} international conference on Fusion energy materials science : Rosenheim 9–13 May 2011 : book of abstracts. — Wersja do Windows. — Dane tekstowe. — [Rosenheim? : s. n.], [2011]. — Dane na dysku Flash. — S. 184. — Wymagania systemowe: Adobe Acrobat Reader. — Bibliogr. s. 184

Atomic-scale characterization of contact interfaces between thermally self-assembled Au islands and $MoS_{2}$ substrate surfaces / E. Gnecco, B. R. Jany, A. George, A. Turchanin, G. CEMPURA, A. KRUK, F. Krok // W: ECOSS36 [Dokument elektroniczny] : 36\textsuperscript{th} European Conference on Surface Science : 28. 08. 2023-01. 09. 2023, Łodz, Poland : abstract book (version 25/08) / Faculty of Physics and Applied Informatics, University of Lodz. — Wersja do Windows. — Dane tekstowe. — [Lodz : Faculty of Physics and Applied Informatics, University of Lodz], [2023]. — S. 37. — Wymagania systemowe: Adobe Reader. — Tryb dostępu: https://ecoss36.eu/pdf/ECOSS36_ConferenceAbstractBook.pdf [2023-09-06]. — Bibliogr. s. 37

Characterisation of $\gamma$' and $\gamma$” strengthening particles in Inconel 718 superalloy by Electron Microscopy and FIB Tomography / A. CZYRSKA-FILEMONOWICZ, A. KRUK, B. DUBIEL, G. CEMPURA // W: IMC17 [Dokument elektroniczny] : International Microscopy Congress : Rio, Brazil, 19–24 September, 2010 : proceedings. — Wersja do Windows. — Dane tekstowe. — [Brazil : Sociedade Brasileira de Microscopia et Microanálise], [cop. 2010]. — 1 dysk optyczny. — S. [1–2]. — Wymagania systemowe: Adobe Acrobat Reader ; napęd CD-ROM. — Bibliogr. s. [1–2]

Characteristics of Al203 layers formed on aluminum alloys by plasma electrolytic oxidation / Mateusz JĘDRUSIK, Grzegorz CEMPURA // W: The 5\textsuperscript{th} Stanisław Gorczyca European school on Electron microscopy and electron tomography : Kraków, 5-8.07.2016 : proceedings / ed. by G. Cempura, A. Gruszczyński, A. Czyrska-Filemonowicz ; AGH University of Science and Technology, International Centre of Electron Microscopy for Materials Science, Faculty of Metals Engineering and Industrial Computer Science. — Kraków : AGH University of Science and Technology, 2016. — Opis częśc. wg okł.. — ISBN: 978-83-63663-81-0. — S. 398–399. — Bibliogr. s. 398–399

Characterization of complex coatings deposited by micro-arc oxidation on Ti6Al7Nb alloy / Joanna KARBOWNICZEK, G. CEMPURA, F. Muhaffel, H. Cimenoglu, A. CZYRSKA-FILEMONOWICZ // W: REDEOR : Unified Scientific Approaches Towards Regenerative Orthopaedics and Dentistry : international conference : 25–27 March 2015, Venice, Italy : conference book. — [Italy : s. n.], [2015]. — S. 48–49

Characterization of gold rich nanostructures on AIII-BV semiconductor surfaces by electron microscopy and machine learning techniques / B. R. Jany, A. Janas, W. Piskorz, K. Szajna, A. KRYSHTAL, G. CEMPURA, P. Indyka, A. KRUK, A. CZYRSKA-FILEMONOWICZ, F. Krok // W: MC 2019 [Dokument elektroniczny] : Microscopy Conference : 1–5 September 2019, Berlin, Germany : abstracts. — Wersja do Windows. — Dane tekstowe. — [Berlin : s. n.], [2019]. — S. 303–304. — Wymagania systemowe: Adobe Reader. — Tryb dostępu: https://www.microscopy-conference.de/fileadmin/congress/media/mc2019/druckelemente/MC2019_Proceedings.pdf [2019-10-04]. — Bibliogr. s. 303

Characterization of the $\gamma$-TiAl microstructure by analytical electron microscopy / G. CEMPURA, B. DUBIEL, A. CZYRSKA-FILEMONOWICZ // W: 5\textsuperscript{th} Polish-Japanese symposium on Advanced methods of materials characterization : 29. 08.–2. 09. 2004 Niedzica, Poland : programme and abstracts. — [Kraków : Polish Academy Of Science. Institute of Metallurgy and Materials Science], [2004]. — S. 12–14. — Bibliogr. s. 14

Characterization of the porous coatings with incorporated silver deposited by micro-arc oxidation : poster / KARBOWNICZEK J., CEMPURA G., Muhaffel F., Cimenoglu H., Kayali S., CZYRSKA-FILEMONOWICZ A. // W: IMC 2014 [Dokument elektroniczny] : 18\textsuperscript{th} International Microscopy Congress : Microscopy for global challenges touching atoms, molecules, nanostructures and cells by multidimensional microscopy : Prague, 7–12 September 2014 : proceedings / ed. Pavel Hozak. — Wersja do Windows. — Dane tekstowe. — [Czech Republic : Czechoslovak Microscopy Society], cop. 2014. — Dysk Flash. — Opis częśc. wg okł.. — S. [1–2], poz. ID-13-P-2298. — Wymagania systemowe: Adobe Reader. — Tytuł przejęto ze strony tytułowej (po wybraniu opcji poz. 2298)

Chemical and structural imaging of gold-rich nanostructures on AIIIBV semiconductors by electron microscopy and machine learning / Benedykt R. Jany, Arkadiusz Janas, Witold Piskorz, Konrad Szajna, Aleksandr KRYSHTAL, Grzegorz CEMPURA, Paulina Indyka, Adam Kruk, Aleksandra CZYRSKA-FILEMONOWICZ, Franciszek Krok // W: IX krajowa konferencja Nanotechnologii NANO 2019 : 1–3 lipca 2019, Wrocław, Polska : książka streszczeń. — Wrocław : Oficyna Wydawnicza Politechniki Wrocławskiej, 2019. — ISBN: 978-83-7493-091-8. — S. 40. — Bibliogr. s. 40

Comparison of the isothermal fatigue behaviour of timetal $6242$ and $\gamma -TiAl$ alloys at $700^{o}$C / G. CEMPURA, H. J. Penkalla, F. Schubert, A. CZYRSKA-FILEMONOWICZ // W: Materials for advanced power engineering 2006 : proceedings of the 8th Liège conference, Pt. 2 / eds.: Jacqueline Lecomte-Beckers [et al.] ; FJ GmbH. Institut für Energieforschung. — Jülich : FJ GmbH, 2006. — (Schriften des Forschungszentrum Jülich. Reihe Energietechnik ; vol. 53 pt. 2). — 50 Jahre Zukunft. — S. 773–782. — Bibliogr. s. 782, Abstr.

Effect of silver acetate concentration on the microstructural and antibacterial properties of oxidized titanium / Dilek Teker Aydogan, Faiz Muhaffel, Meryem Menekse, Ozge Karabiyik Acar, Grzegorz CEMPURA, Murat Baydogan, Nevin Gul Karaguler, Gamze Torun Kose, Aleksandra CZYRSKA-FILEMONOWICZ, Husein Cimenoglu // W: ESB 2017 [Dokument elektroniczny] : 28\textsuperscript{th} annual conference of the European Society for Biomaterials (ESB) : translational activities for exploiting research on biomaterials : September 4–8, 2017, Athens, Greece : book of abstracts. — Wersja do Windows. — Dane tekstowe. — [Athens : s. n.], [2017]. — Dysk Flash. — S. 319. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 319

Elastic properties of thin nanocrystalline wc-c and $TiB_{2}$ coatings by nanoindentation and AFM / F. Lofaj, G. CEMPURA, P. Hviščova, A. Duszová, J. Dusza, M. Mikula, P. Kúš // W: Seeing at the Nasnoscale VIII : an international conference : August 30–September 01, 2010 : Basel, Switzerland : abstracts. — [Switzerland : s. l.], [2010]. — Na okł. dod.: Exploring the future of nanotechnology using SPM and related techniques. — S. [1]

Electron microscopy, spectroscopy and tomography - complementary techniques for characterisation of Ni-base superalloys down to the nanoscale / S. LECH, A. CZYRSKA-FILEMONOWICZ, G. CEMPURA, A. KRUK // W: 13\textsuperscript{th} Polish-Japanese joint seminar on Micro and nano analysis : [25–28 September 2022, Ustroń] : abstract book. — [Katowice : University of Silesia], [2022]. — S. 83–84. — Bibliogr. s. 84

Electron microscopy, spectroscopy and tomography for energy material's applications : [abstract] / Grzegorz CEMPURA, Adam KRUK // W: MODENERLANDS COST ACTION CA20109 : modular energy islands for sustainability and resilience : meeting booklet for the 1\textsuperscript{st} working group meeting and 2\textsuperscript{nd} management committee meeting 2022 : Coimbra, Portugal, April 11–12, 2022 / ed. by Carlos Rebelo, [et al.]. — [Brussels : European Cooperation in Science & Technology], [2022]. — S. 38

Electrophoretic deposition of ceramic coatings for solid oxide cells: challenges and perspectives / Federico Smeacetto, Sebastian Molin, Antonio G. Sabato, Elisa Zanchi, Grzegorz CEMPURA, Aldo R. Boccaccini // W: 7\textsuperscript{th} international conference on Electrophoretic deposition: fundamentals and applications [Dokument elektroniczny] : October 30 – November 3, 2022, Santa Fe, New Mexico, USA / ed. Aldo R. Boccaccini, Begoña Ferrari, Andrew Pascall, Tetsuo Uchikoshi. — Wersja do Windows. — Dane tekstowe. — [New York : ECI], [2022]. — S. [19]. — Wymagania systemowe: Adobe Reader. — Tryb dostępu: http://engconf.us/conferences/materials-science-including-nanotechnology/electrophoretic-deposition-vii-fundamentals-and-applications/ [2022-11-08]. — Bibliogr. s. [19]. — Dostęp po zalogowaniu

esteem 2 : European network for electron microscopy : 4th Stanislaw Gorczyca European School on TEM basics and advanced sample preparation : Kraków, 1–4.10.2013 : proceedings / eds. G. CEMPURA, A. CZYRSKA-FILEMONOWICZ. — Kraków : Wydawnictwo Naukowe "Akapit", cop. 2013. — 327 s.. — ISBN: 978-83-63663-36-0. — A. Czyrska-Filemonowicz – brak afiliacji AGH