Wykaz publikacji wybranego autora

Adam Gołda, dr inż.

adiunkt

Wydział Informatyki, Elektroniki i Telekomunikacji
WIEiT-ke, Katedra Elektroniki


Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: brak

ResearcherID: C-2122-2013

Scopus: brak

PBN: 909651

OPI Nauka Polska




Opisy publikacji wcześniejszych zobacz: bpp.agh.edu.pl/old.


Liczba pozycji spełniających powyższe kryteria selekcji: 64, z ogólnej liczby 65 publikacji Autora


1
  • AnaDig – an educational chip for VLSI device characterization
2
  • Analysis and design of PTAT temperature sensor in digital CMOS VLSI circuits
3
  • Analysis and verification of integrated circuit thermal parameters
4
  • Analysis of parameter-based temperature-controlled oscillator dedicated to method of optimum control of throughput
5
  • Analysis of steady state temperature distribution in CMOS integrated circuits
6
  • ASIC for investigations into thermal aspects in CMOS integrated circuits
7
  • ASIC implementation of high efficiency 8-bit 'OctaLynx' RISC microprocessor
8
  • ASIC implementation of high efficiency 8-bit “OctaLynx” RISC microprocessor
9
  • Asynchronous 4-bit flash analog-to-digital CMOS converter with over- and underflow detection system
10
  • A charge pump integrated in 180nm CMOS technology for voltage conversion in heat energy harvesters
11
  • A charge pump with power-on reset circuit
12
  • A set of temperature sensors and maximum temperature selection circuit
13
  • Design and testing of CMOS asynchronous flash analog-to-digital converter
14
  • Design and tests of CMOS phase locked-loop
15
  • Design of CMOS analog and digital phase-locked loops based on resonant VCO
16
  • Effective supervisors for predictive methods of dynamic power management
17
  • Electronic aid system for the visually impaired
18
  • Embedded PTAT temperature sensor for CMOS VLSI circuits
19
  • Energy collected by MOSFET capacitance and its temperature dependence
20
  • Energy losses in digital CMOS integrated circuits: state-of-the-art and future trends
21
  • Experimental verification of energy losses in CMOS gates
22
  • Extraction of integrated circuit thermal parameters
23
24
  • Fractal geometries in lateral flux capacitor design
25
  • Generator sygnału zerującego