Wykaz publikacji wybranego autora

Dariusz Węgrzynek, dr hab. inż.

adiunkt

Wydział Fizyki i Informatyki Stosowanej
WFiIS-kfmb, Katedra Fizyki Medycznej i Biofizyki

[dyscyplina wiodąca] dziedzina nauk ścisłych i przyrodniczych / nauki fizyczne


Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: 0000-0002-1403-0863

ResearcherID: brak

Scopus: 6701840372

PBN: 900805

OPI Nauka Polska

System Informacyjny AGH (SkOs)





Liczba pozycji spełniających powyższe kryteria selekcji: 50, z ogólnej liczby 51 publikacji Autora


1
  • A feasibility study: computer micro tomography using laboratory X-ray fluorescence micro-beam spectrometer
2
  • A Monte Carlo simulation of confocal X-ray fluorescence experiment
3
  • A portable micro-X-ray fluorescence spectrometer with polycapillary optics and vacuum chamber for archaeometric and other applications
4
  • Application of the backscatter fundamental parameter method for \emph {in situ} element determination using a portable energy-dispersive X-ray fluorescence spectrometer
5
  • Application of X-ray fluorescence techniques for the determination of hazardous and essential trace elements in environmental and biological materials
6
  • Applications of a new portable (micro) XRF instrument having low-Z elements determination capability in the field of works of art
7
  • Atomic spectrometry update
8
  • Atomic spectrometry update – X-ray fluorescence spectrometry
9
  • Atomic spectrometry update-X-ray fluorescence spectrometry
10
  • Atomic spectrometry update-X-ray fluorescence spectrometry
11
12
  • Computer microtomography using a laboratory x-ray fluorescence microbeam spectrometer – A feasibility study
13
  • Depth profiling of element concentrations in stratified materials by confocal microbeam X-ray fluorescence spectrometry with polychromatic excitation
14
15
16
  • Determination of the elemental distribution in human joint bones by SR micro XRF
17
  • Development and applications of portable XRF spectrometers for {\em in situ} characterization of materials
18
19
20
21
  • Direct deconvolution procedure for the quantification of multi-layer samples by confocal micro-XRF spectroscopy
22
  • Evaluation of the energy-dispersive x-ray spectra of high-Z elements using Gaussian and Voigt peak shape profiles
23
  • Evaluation of the uncertainty of element determination using the energy-dispersive x-ray fluorescence technique and the emission-transmission method
24
  • Experimental evaluation of X-ray optics applied for microanalysis
25