A method of thermal testing of microsystems / Piotr BRATEK, Andrzej KOS // Microelectronics Reliability ; ISSN 0026-2714. — 2001 vol. 41 iss. 11, s. 1877–1887. — Bibliogr. s. 1886–1887, Abstr.. — tekst: https://www-1sciencedirect-1com-1000027cs0111.wbg2.bg.agh.edu.pl/science/article/pii/S0026271401000889/pdfft?md5=88285ba51db5eb5a8553c56487b5ed42&pid=1-s2.0-S0026271401000889-main.pdf

Energy consumption by CMOS gates / Adam GOŁDA, Andrzej KOS // W: ICSES'2001 : proceedings of the International Conference on Signals and Electronic Systems : Łódź, 18–21 September 2001 / ed. Paweł Strumiłło. — [Łódź : Institute of Electronics Technical University : CMYK], [2001]. — ISBN10: 8391061558. — S. 425–430. — Bibliogr. s. 430, Abstr.

Fault localisation in Integrated Circuits by thermal method / Piotr BRATEK, Andrzej KOS // W: MTM 2001 : 5\textsuperscript{th} [fifth] international symposium on Microelectronics Technologies and Microsystems : Piteşti, June 7–9, 2001. — [Piteşti : s. n.], [2001]. — S. [72–77]. — Bibliogr. s. [77]

IDD current monitoring cell for VLSI circuits – design and testing / Piotr DZIURDZIA, Ireneusz BRZOZOWSKI, Piotr BRATEK, Andrzej KOS // W: ICSES'2001 : proceedings of the International Conference on Signals and Electronic Systems : Łódź, 18–21 September 2001 / ed. Paweł Strumiłło. — [Łódź : Institute of Electronics Technical University : CMYK], [2001]. — ISBN10: 8391061558. — S. 363–368. — Bibliogr. s. 368, Abstr.

Logic synthesis method for power dissipation reduction in combinational digital circuits / Ireneusz BRZOZOWSKI, Andrzej KOS // Bulletin of the Polish Academy of Sciences. Technical Sciences ; ISSN 0239-7528. — 2001 vol. 49 no. 4, s. 581–594. — Bibliogr. s. 593–594, Abstr.

Monitoring of power dissipated in microelectronic structures / Piotr DZIURDZIA, Andrzej KOS // Microelectronics Reliability ; ISSN 0026-2714. — 2001 vol. 41 iss. 12, s. 1971–1978. — Bibliogr. s. 1977–1978, Abstr.. — tekst: https://www-1sciencedirect-1com-10000276c0219.wbg2.bg.agh.edu.pl/science/article/pii/S0026271401001238/pdfft?md5=629da317489e2cc85577d79833147da8&pid=1-s2.0-S0026271401001238-main.pdf

On thermal time constants of VLSI circuits / Andrzej KOS // W: Advances in microelectronic device technology : 7–9 November 2001 Nanjing, China / eds. Qin-Yi Tong, Ulrich M. Goesele ; SPIE [The International Society for Optical Engineering]. — [China] : SPIE, 2001. — (Proceedings of SPIE / The International Society for Optical Engineering ; ISSN 0277-786X ; vol. 4600). — ISBN10: 0-8194-4339-5. — S. 160–169. — Bibliogr. s. 169, Abstr.

Power dissipation in simple CMOS gates / A. GOŁDA, A. KOS // W: MIXDES 2001 : MIXed DESign of integrated circuits and systems : proceedings of the 8\textsuperscript{th} international conference : Zakopane, Poland 21–23 June 2001 / [ed. by Andrzej Napieralski] ; org. by Department of Microelectronics and Computer Science, Technical University of Lodz, Poland in cooperation with: Poland Section IEEE - CAS & ED Chapters [et al.].. — [Łódź : "LodArt"], [2001]. — ISBN10: 8387202983. — S. 221–224. — Bibliogr. s. 224, Abstr.

SPICE based simulations of electrothermal processes / Piotr DZIURDZIA, Andrzej KOS // W: Proceedings of the 2\textsuperscript{nd} [second] international conference on Benefiting from thermal and mechanical simulation in (micro)-electronics : 9–11 April 2001 Paris, France / eds. G. Q. Zhang, L. J. Ernst, O. de Saint Leger. — [France] : Europia productions, 2001. — S. 297–301. — Bibliogr. s. 301, Abstr.

Temperature sensors placement strategy for fault diagnosis in Integrated Circuits / Piotr BRATEK, Andrzej KOS // W: SEMI-THERM : semiconductor thermal measurement and management symposium : San Jose, CA USA March 20–22, 2001 : proceedings 2001. — [Piscataway : IEEE], [2001]. — (Seventeenth Annual IEEE). — Na okł. dodatkowo: 1950–2000 Celebrating 50 [fiftieth] years of technology. — ISBN10: 0-7803-6649-2. — S. 245–251. — Bibliogr. s. 251, Abstr.. — tekst: https://ieeexplore-1ieee-1org-1000047i60104.wbg2.bg.agh.edu.pl/stamp/stamp.jsp?tp=&arnumber=915185

Thermal time constants of various substrates of integrated circuits / Andrzej KOS // Microelectronics International ; ISSN 1356-5362. — 2001 vol. 18 no. 3, s. 9–14. — Bibliogr. s. 14, Abstr.. — tekst: https://search-1proquest-1com-1ysv0kvyr01be.wbg2.bg.agh.edu.pl/docview/216512514/fulltextPDF/981F257EC6834027PQ/4?accountid=48679

Tool for fast modelling active heat sinks / Piotr DZIURDZIA, Andrzej KOS // W: SEMI-THERM : semiconductor thermal measurement and management symposium : San Jose, CA USA March 20–22, 2001 : proceedings 2001. — [Piscataway : IEEE], [2001]. — (Seventeenth Annual IEEE). — Na okł. dodatkowo: 1950–2000 Celebrating 50 [fiftieth] years of technology. — ISBN10: 0-7803-6649-2. — S. 174–179. — Bibliogr. s. 179, Abstr.. — tekst: https://ieeexplore-1ieee-1org-1000047i60109.wbg2.bg.agh.edu.pl/stamp/stamp.jsp?tp=&arnumber=915175

Web-based teaching on ASIC design / P. BRATEK, P. DZIURDZIA, I. BRZOZOWSKI, A. KOS // W: MIXDES 2001 : MIXed DESign of integrated circuits and systems : proceedings of the 8\textsuperscript{th} international conference : Zakopane, Poland 21–23 June 2001 / [ed. by Andrzej Napieralski] ; org. by Department of Microelectronics and Computer Science, Technical University of Lodz, Poland in cooperation with: Poland Section IEEE - CAS & ED Chapters [et al.].. — [Łódź : "LodArt"], [2001]. — ISBN10: 8387202983. — S. 533–536. — Bibliogr. s. 536, Abstr.