Properties of image sensor structure obtained below 120stC on the foil by reactive magnetron sputtering / A. KOŁODZIEJ, P. KREWNIAK, R. TADEUSIEWICZ // W: Flat–panel displays and sensors – principles, materials and processes : symposium : April 5–9, 1999, San Francisco, California, USA / eds. F. R. Libisch [et al.] ; Materials Research Society. — Warrendale : MRS, 2000. — (Materials Research Society Symposium Proceedings ; ISSN 0272-9172 ; vol. 558). — ISBN10: 1-55899-465-3. — S. [1–6]. — Bibliogr. s. [6], Abstr.. — Toż w wersji drukowanej: s. 243—248. — ISBN 1-55899-465-3

Wide bandgap $≥$1.8eV amorphous silicon for solar multijunction cell and image sensor applications / Andrzej KOŁODZIEJ, Paweł KREWNIAK, Ryszard TADEUSIEWICZ // W: Amorphous and heterogeneous silicon thin films – 2000 : symposium : April 24–28, 2000, San Francisco / eds. R. W. Collins [et al.]. — Warrendale : MRS, 2000. — (Materials Research Society Symposium Proceedings ; ISSN 0272-9172 ; vol. 609). — S. A5.2.1–A5.2.6. — Bibliogr. s. A5.2.6, Abstr.