Effect of preparation conditions on the structural properties of emeraldine base / J. LASKA, W. ŁUŻNY, J. WIDLARZ, M. ŚNIECHOWSKI // W: World polymer congress : IUPAC MACRO 2000 : 38\textsuperscript{th} Macromolecular IUPAC symposium : Warsaw 9–14 July 2000 : book of abstracts, Vol. 2. — [Warsaw : Warsaw University of Technology], [2000]. — S. 866. — Bibliogr. s. 866

Esters of 5–sulfo-$i$-phthalic acid as new dopants improving the solution processibility of polyaniline : spectroscopic, structural and transport properties of the doped polymer / I. Kulszewicz-Bajer, M. Zagórska, J. NIZIOŁ, A. PROŃ, W. ŁUŻNY // Synthetic Metals ; ISSN 0379-6779. — 2000 vol. 114 iss. 2, s. 125–131. — Bibliogr. s. 131, Abstr.. — tekst: https://www-1sciencedirect-1com-10000274o00d9.wbg2.bg.agh.edu.pl/science/article/pii/S0379677900002368/pdfft?md5=0767a258666d3d697f58119ec3491adb&pid=1-s2.0-S0379677900002368-main.pdf

Polyaniline thin films – structural anisotropy study by use of synchrotron radiation surface diffraction / W. ŁUŻNY, E. J. Samuelsen, D. W. Breiby // W: ICSM 2000 : international conference on Science and technology of synthetic metals : 15\textsuperscript{th}–21\textsuperscript{st} of July 2000 Gastein, Austria : book of abstracts. — Amsterdam [et al.] : Elsevier, 2000. — S. 36–37

Relations between the structure and electric conductivity of polyaniline protonated with camphorsulfonic acid / W. ŁUŻNY, E. BAŃKA // Macromolecules / American Chemical Society ; ISSN 0024-9297. — 2000 vol. 33 iss. 2, s. 425–429. — Bibliogr. s. 429, Abstr.. — Publikacja dostępna online od: 2000-01-05. — tekst: https://pubs-1acs-1org-137rjw96j01d5.wbg2.bg.agh.edu.pl/doi/pdf/10.1021/ma9913663

Structure of polyanilines: the review of some recent results / W. ŁUŻNY, E. BAŃKA, E. STOCHMAL-POMORZAŃSKA // W: X-ray investigations of polymer structures II : 2–5 December 1999 Szczyrk / ed. Andrzej Włochowicz. — [Poland : s. n.] : The International Society for Optical Engineering, 2000. — (Proceedings of SPIE / The International Society for Optical Engineering ; ISSN 0277-786X ; vol. 4240). — S. 47–50. — Bibliogr. s. 50, Abstr.. — tekst: https://www-1spiedigitallibrary-1org-19ixtjq0300b1.wbg2.bg.agh.edu.pl/proceedings/Download?fullDOI=10.1117%2F12.401850&downloadType=proceedings%20article&DOI=10.1117%2F12.401850&isResultClick=True

Surface diffraction study of structural anisotropy of selected polyaniline thin films / Emil J. Samuelsen, Dag W. Breiby, Wojciech ŁUŻNY // W: HASYLAB Annual Report 2000, Pt. 1. / ed. by W. Dix [et al.]. — Hamburg : Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY, 2000. — S. [1–2]. — Bibliogr. s. [2]